Josephson Dynamics at High Transmissions: Voltage and Current Bias Limits
- Authors: Galaktionov A.V.1, Zaikin A.D.1
- 
							Affiliations: 
							- Tamm Department of Theoretical Physics, Lebedev Physical Institute, Russian Academy of Sciences
 
- Issue: Vol 118, No 9-10 (11) (2023)
- Pages: 671-676
- Section: Articles
- URL: https://rjeid.com/0370-274X/article/view/664225
- DOI: https://doi.org/10.31857/S1234567823210073
- EDN: https://elibrary.ru/PSJPUI
- ID: 664225
Cite item
Abstract
We establish a direct relation between the I–V curves for highly transparent Josephson junctions in the voltage- and current-biased regimes. We demonstrate that the presence of sub-Ohmic dissipation at subgap voltages and temperatures yields the linear dependence of the average voltage 
About the authors
A. V. Galaktionov
Tamm Department of Theoretical Physics, Lebedev Physical Institute, Russian Academy of Sciences
														Email: galakt@lpi.ru
				                					                																			                												                								119991, Moscow, Russia						
A. D. Zaikin
Tamm Department of Theoretical Physics, Lebedev Physical Institute, Russian Academy of Sciences
							Author for correspondence.
							Email: galakt@lpi.ru
				                					                																			                												                								119991, Moscow, Russia						
References
- M. Tinkham, Introduction to Superconductivity, 2nd ed., McGraw-Hill, N.Y. (1996).
- A. Barone and G. Paterno, Physics and Applications of the Josephson Effect, John Wiley & Sons, N.Y. (1982).
- K.K. Likharev, Dynamics of Josephson Junctions and Circuits, Gordon and Breach, N.Y. (1986).
- M. Octavio, M. Tinkham, G. E. Blonder, and T.M. Klapwijk, Phys. Rev. B 27, 6739 (1983).
- U. Gunsenheimer and A.D. Zaikin, Phys. Rev. B 50, 6317 (1994).
- D. Averin and A. Bardas, Phys. Rev. Lett. 75, 1831 (1995).
- D. Averin and A. Bardas, Phys. Rev. B 53, R1705 (1996).
- E. Bocquillon, J. Wiedenmann, R. S. Deacon, T.M. Klapwijk, H. Buhmann, and L.W. Molenkamp, Microwave studies of the fractional Josephson effect in HgTe-based Josephson junctions, in Topological Matter, ed. by D. Bercioux, J. Cayssol, M. Vergniory, and M. Reyes Calvo, Springer Series in Solid-State Sciences, Springer, Cham, Switzerland (2018), v. 190, p. 115.
- M.C. Dartiailh, J. J. Cuozzo, B.H. Elfeky, W. Mayer, J. Yuan, K. S. Wickramasinghe, E. Rossi, and J. Shabani, Nat. Comm. 12, 78 (2021).
- P. Zhang, S. Mudi, M. Pendharkar, J. S. Lee, C. P. Dempsey, A.P. McFadden, S.D. Harrington, J.T. Dong, H. Wu, A.-H. Chen, M. Hocevar, C. J. Palmstrøm, and S.M. Frolov, arXiv:2211.08710v1.
- A.V. Galaktionov and A.D. Zaikin, Phys. Rev. B 104, 054521 (2021).
- J.C. Cuevas, A. Mart'ın-Rodero, and A. Levy Yeyati, Phys. Rev. B 54, 7366 (1996).
- I.O. Kulik and A.N. Omel'yanchuk, Fizika Nizkikh Temperatur 3, 945 (1977)
- Sov. J. Low Temp. Phys. 3, 459 (1977).
- A.V. Galaktionov and A.D. Zaikin, Phys. Rev. B 107, 214507 (2023).
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