Behavior Features of the Approach Curve of a Scanning Ion-Conductance Microscope

S. Yu. Lukashenko; Лукашенко С. Ю.; O. M. Gorbenko; Горбенко О. М.; M. V. Zhukov; Жуков М. В.; S. V. Pichahchi; Пичахчи С. В.; I. D. Sapozhnikov; Сапожников И. Д.; M. L. Felshtyn; Фельштын М. Л.; A. O. Golubok; Голубок А. О.

doi:10.31857/S1028096023050102

Behavior Features of the Approach Curve of a Scanning Ion-Conductance Microscope

Авторлар: Lukashenko S.Y.¹, Gorbenko O.M.¹, Zhukov M.V.¹, Pichahchi S.V.¹, Sapozhnikov I.D.¹, Felshtyn M.L.¹, Golubok A.O.¹
Мекемелер:
1. IAI RAS
Шығарылым: № 5 (2023)
Беттер: 65-72
Бөлім: Articles
URL: https://rjeid.com/1028-0960/article/view/664567
DOI: https://doi.org/10.31857/S1028096023050102
EDN: https://elibrary.ru/KVIJJZ
ID: 664567

Дәйексөз келтіру

Толық мәтін

Ашық рұқсат
Рұқсат жабық

Рұқсат берілді
Рұқсат жабық

Тек жазылушылар үшін

Аннотация
Авторлар туралы
Әдебиет тізімі
Қосымша файлдар
Статистика

Аннотация

The operation of a scanning ion-conductance microscope is based on the assumption that the ion current I(z) flowing in an electrolyte solution through the narrow aperture of a probe in the form of a glass nanopipette has a maximum saturation value away from the sample under study and decreases as the probe approaches the surface. The value of the scanning ion-conductance microscope operating current is usually chosen near the saturation current I ~ 09I_sat. However, in some cases there is an unusual behavior of the I(z) approach curve near the surface when the ion current increases as the nanopipette approaches the sample surface. The appearance of a peak on the I(z) curve as the nanopipette approaches the sample surface is what we call the “peak effect”. It is obvious that the peak effect can lead to a failure in the operation of the scanning ion-conductance microscope servo system and noise at the images getting by scanning ion-conductance microscope. In this work the appearance of a peak on the approach curve have been studied experimentally. Considering the nanopipette near the sample surface as a microfluidic system in the form of a T – shaped channel the I(z) dependence using the finite element method and the СOMSOL software package have been calculated.

Негізгі сөздер

scanning ion conductance microscopy, nanopipette, surface charge, polymers, approach curve, microfluidic system.

Әдебиет тізімі

Hansma P.K., Drake B., Marti O., Gould S.A., Prater S.B. // Science 1989. V. 243. P. 641. https://www.doi.org/10.1126/science.2464851
Shevchuk A.I., Frolenkov G.I., Sanchez D., James P.S., Freedman N., Lab M.J., Jones R., Klenerman D., Korchev Y.E. // Angew. Chem. Int. Ed. 2006. V. 45. P. 2212. https://www.doi.org/10.1002/anie.200503915
Макарова Е.С., Яминский И.В. // Медицина и высокие технологии 2016. Т. 1. С. 39.
Яминский И.В., Ахметова А.И., Советников Т.О., Тихомирова М.А., Янг Ш. // Наноиндустрия 2022. Т. 15. № 3. С. 168. https://www.doi.org/10.22184/1993-8578.2022.15.3-4.168.173
Comstock D.J., Elam J.W., Pellin M.J., Hersam M.C. // Anal. Chem. 2010. V. 82. P. 1270. https://www.doi.org/10.1021/ac902224q
Rodolfa K.T., Bruckbauer A., Zhou D., Korchev Y.E., Klenerman D. // Angew. Chem. Int. Ed. 2005. T. 44. P. 6854. https://www.doi.org/10.1002/anie.200502338
Momotenko D., Page A., Adobes-Vidal M., Unwin P.R. // ACS Nano V. 10. P. 8871. https://www.doi.org/10.1021/acsnano.6b04761
Shevchuk A.I., Hobson P., Lab M.J., Klenerman D., Krauzewicz N., Korchev Y.E. // Pflugers Arch. Eur. J. Physiol. 2008. V. 456. P. 227. https://www.doi.org/10.1007/s00424-007-0410-4
Dorwling-Carter L., Aramesh M., Han H., Zambelli T., Momotenko D. // Anal. Chem. 2018. V. 90. P. 19.
Thatenhorst D., Rheinlaender J., Schaffer T.E., Dietzel I.D., Happel P. // Anal. Chem. 2014. V. 86. P. 9838.
Rheinlaender J., Schäffer T.E. // Anal. Chem. 2017. V. 89. P. 11875. https://www.doi.org/10.1021/acs.analchem.7b03871
Wei C., Bard A.J., Feldberg S.W. // Anal. Chem. 1997. V. 69. P. 4627. https://www.doi.org/10.1021/ac970551g
Chen C-C., Zhou Y., Baker L.A. // Annu. Rev. Anal. Chem. 2012. V. 5. P. 207. https://www.doi.org/10.1146/annurev-anchem-062011- 143203
Chen C-C., Bake L.A. // Analyst 2011. V. 136. P. 90. https://www.doi.org/10.1039/C0An00604A
Novak P. et al. // Nat. Methods 2009. V. 6. P. 279. https://www.doi.org/10.1038/nmeth.1306
Sa N., Baker L.A. // J. Am. Chem. Soc. 2011. V. 133. P. 10398. https://www.doi.org/10.1021/ja203883q
McKelvey K., Kinnear S.L., Perry D., Momotenko D., Unwin P.R. // J. Am. Chem. Soc. 2014. V. 136. P. 13. https://www.doi.org/10.1021/la5020412
Yingfei M., Rujia L., Xiaoyue S., Dengchao W. // Chem. Electrochem. 2021. V. 8. P. 3917. https://www.doi.org/10.1002/celc.202101180
Sa N., Lan W.J., Shi W., Baker L.A. // ACS Nano 2013. V. 7. №. 11. P. 272. https://www.doi.org/10.1021/nn4050485.
Clarke R.W., Zhukov A., Richards O., Johnson N., Ostanin V., Klenerman D. // American Chem. Soc. 2012. https://www.doi.org/10.1021/ja3094586
Zhukov M.V., Lukashenko S.Yu., Sapozhnikov I.D., Felshtyn M.L., Gorbenko O.M., Golubok A.O. // J. Phys.: Conf. Ser. 2021. V. 2086. https://www.doi.org/10.1088/1742-6596/2086/1/012074
Zhang L., Biesheuve P.M., Ryzhkov I.I. // Phys. Rev. Appl. 2019. V. 12. P. 014039. https://www.doi.org/10.1103/PhysRevApplied.12.014039
Bannard J.E. // J. Appl. Electrochem. 1975. V. 5. P. 43. https://www.doi.org/10.1007/BF00625958