Mikroèlektronika
ISSN 0544-1269 (Print)
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Keywords
Förster effect
bipolar transistor
charge qubit
etching
fluorine atoms
fluorocarbon gases
gas temperature
kinetics
magnetron sputtering
mechanism
memristor
modeling
molecular beam epitaxy
plasma
polymerization
quantum dot
radiation intensity
reduced electric field strength
resistive switching
silicon
specific power
Current Issue
Vol 54, No 1 (2025)
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Keywords
Förster effect
bipolar transistor
charge qubit
etching
fluorine atoms
fluorocarbon gases
gas temperature
kinetics
magnetron sputtering
mechanism
memristor
modeling
molecular beam epitaxy
plasma
polymerization
quantum dot
radiation intensity
reduced electric field strength
resistive switching
silicon
specific power
Current Issue
Vol 54, No 1 (2025)
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Author Details
Saenko, A. V.
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Title
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Vol 53, No 4 (2024)
ДИАГНОСТИКА
Study of the Photovoltaic Parameters of Inorganic Solar Cells Based on Cu
2
O and CuO
Vol 53, No 1 (2024)
ПРИБОРЫ
Research of Memristor Effect in Crossbar Architecture for Neuromorphic Artificial Intelligence Systems
Vol 52, No 4 (2023)
ТЕХНОЛОГИИ
Effect of Magnetron Sputtering Power on ITO Film Deposition at Room Temperature
Vol 54, No 1 (2025)
ТЕХНОЛОГИИ
Study of deposition modes of Cu
2
O films by RF magnetron sputtering for application in solar cell structures
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