Differentiation of optical signals using an integrated metal-dielectric-metal structure

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Аннотация

We consider optical properties of integrated metal-dielectric-metal structures embedded in a dielectric slab waveguide and their application to the problems of first- and second-order optical differentiation of the profile of the incident optical beam in reflection. According to the presented numerical simulation results, the investigated structures enable performing the spatial differentiation operation with high quality. The presented results may find application in novel systems for optical information processing and analog optical computing based on integrated nanophotonic structures.

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A. Kashapov

Image Processing Systems Institute, National Research Centre “Kurchatov Institute”; Samara National Research University

Хат алмасуға жауапты Автор.
Email: ar.kashapov@outlook.com
Ресей, Samara; Samara

E. Bezus

Image Processing Systems Institute, National Research Centre “Kurchatov Institute”; Samara National Research University

Email: ar.kashapov@outlook.com
Ресей, Samara; Samara

D. Bykov

Image Processing Systems Institute, National Research Centre “Kurchatov Institute”; Samara National Research University

Email: ar.kashapov@outlook.com
Ресей, Samara; Samara

L. Doskolovich

Image Processing Systems Institute, National Research Centre “Kurchatov Institute”; Samara National Research University

Email: ar.kashapov@outlook.com
Ресей, Samara; Samara

Әдебиет тізімі

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2. Fig. 1. Geometry of single (a) and “double” (b) integral MDM structures, as well as a schematic representation of the calculation of the first spatial derivative of a single MDM structure (a).

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3. Fig. 2. Beam profiles for the width σ = 10 μm (dashed blue line) and σ = 50 μm (solid line) reflected from the integrated MDM structure with metal strips of gold (a) and chromium (b); the analytical function corresponding to the derivative (9) (dashed black line).

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4. Fig. 3. The PF modulus of the investigated double integral MDM structure (solid line) (4) and the normalized spectrum of the incident beam profile (5) (dashed line) (a); the numerically calculated profile of the reflected beam by the method [13] (solid line) and the analytical function corresponding to the second derivative (10) (dashed line) (b).

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