Surface cracks and texture influence on residual stresses in tungsten after plasma exposure
- Авторлар: Balash I.I.1,2,3, Kazantsev S.R.1,2,4, Shmakov A.N.1,3,4, Piminov P.A.1,4, Borin V.M.1
- 
							Мекемелер: 
							- Budker Institute of Nuclear Physics of the Siberian Branch of the Russian Academy of Sciences
- Institute of Solid State Chemistry and Mechanochemistry of the Siberian Branch of the Russian Academy of Sciences
- Institute of High Current Electronics of the Siberian Branch of the Russian Academy of Sciences
- Synchrotron Radiation Facility – Siberian Circular Photon Source “SKIF”, Boreskov Institute of Catalysis of the Siberian Branch of the Russian Academy of Sciences
 
- Шығарылым: Том 87, № 5 (2023)
- Беттер: 692-695
- Бөлім: Articles
- URL: https://rjeid.com/0367-6765/article/view/654407
- DOI: https://doi.org/10.31857/S0367676522701113
- EDN: https://elibrary.ru/KVLVQE
- ID: 654407
Дәйексөз келтіру
Аннотация
Tungsten samples have been studied after being irradiated by the BETA facility’s electron beam for the purpose of simulating plasma heat loads in a fusion reactor’s vacuum chamber. X-ray diffraction methods were used for residual stress measurement in the irradiated samples, some of which were manufactured according to the ITER specifications.
Авторлар туралы
I. Balash
Budker Institute of Nuclear Physics of the Siberian Branch of the Russian Academy of Sciences; Institute of Solid State Chemistry and Mechanochemistry of the Siberian Branch of the Russian Academy of Sciences; Institute of High Current Electronics of the Siberian Branch of the Russian Academy of Sciences
							Хат алмасуға жауапты Автор.
							Email: ilyabalash@yandex.ru
				                					                																			                												                								Russia, 630090, Novosibirsk; Russia, 630128, Novosibirsk; Russia, 634055, Tomsk						
S. Kazantsev
Budker Institute of Nuclear Physics of the Siberian Branch of the Russian Academy of Sciences; Institute of Solid State Chemistry and Mechanochemistry of the Siberian Branch of the Russian Academy of Sciences; Synchrotron Radiation Facility – Siberian Circular Photon Source “SKIF”, Boreskov Institute of Catalysisof the Siberian Branch of the Russian Academy of Sciences
														Email: ilyabalash@yandex.ru
				                					                																			                												                								Russia, 630090, Novosibirsk; Russia, 630128, Novosibirsk; Russia, 630559, Koltsovo						
A. Shmakov
Budker Institute of Nuclear Physics of the Siberian Branch of the Russian Academy of Sciences; Institute of High Current Electronics of the Siberian Branch of the Russian Academy of Sciences; Synchrotron Radiation Facility – Siberian Circular Photon Source “SKIF”, Boreskov Institute of Catalysisof the Siberian Branch of the Russian Academy of Sciences
														Email: ilyabalash@yandex.ru
				                					                																			                												                								Russia, 630090, Novosibirsk; Russia, 634055, Tomsk; Russia, 630559, Koltsovo						
P. Piminov
Budker Institute of Nuclear Physics of the Siberian Branch of the Russian Academy of Sciences; Synchrotron Radiation Facility – Siberian Circular Photon Source “SKIF”, Boreskov Institute of Catalysisof the Siberian Branch of the Russian Academy of Sciences
														Email: ilyabalash@yandex.ru
				                					                																			                												                								Russia, 630090, Novosibirsk; Russia, 630559, Koltsovo						
V. Borin
Budker Institute of Nuclear Physics of the Siberian Branch of the Russian Academy of Sciences
														Email: ilyabalash@yandex.ru
				                					                																			                												                								Russia, 630090, Novosibirsk						
Әдебиет тізімі
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- Makhlaj V.A., Garkusha I.E., Malykhin S.V. et al. // Phys. Scripta. 2009. V. 2009. No. T138. Art. No. 014060.
- Warren B.E. X-Ray diffraction. N.Y.: Dover publications, 1990. 400 p.
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- Balash I.I., Arakcheev A.S., Sharafutdinov A.N. et al. // AIP Conf. Proc. 2020. V. 2299. Art No. 040006.
 
				
			 
						 
					 
						 
						 
						

 
  
  
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