Informaçao sobre o Autor
Андреев, В. В.
| Edição | Seção | Título | Arquivo |
| Nº 1 (2023) | Articles | Change in the Charge State of MOS Structures with a Radiation-Induced Charge under High-Field Injection of Electrons |
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Palavras-chave
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
density functional theory
electron microscopy
electronic structure
ion implantation
irradiation
magnetron sputtering
microstructure
nanoparticles
neutron reflectometry
phase composition
scanning electron microscopy
silicon
structure
surface
surface morphology
synchrotron radiation
thin films
zinc oxide
Edição corrente
Nº 11 (2024)
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Usuário
Assinatura
Entrar no sistema para verificar sua assinatura
Palavras-chave
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
density functional theory
electron microscopy
electronic structure
ion implantation
irradiation
magnetron sputtering
microstructure
nanoparticles
neutron reflectometry
phase composition
scanning electron microscopy
silicon
structure
surface
surface morphology
synchrotron radiation
thin films
zinc oxide
Edição corrente
Nº 11 (2024)
Informações