ESTIMATION OF FLUCTUATIONS OF ALUMINUM ELECTRODE POTENTIAL IN CHLORIDE-CONTAINING AT ANODIC POLARIZATION BY MICROCURRENTS

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Resumo

The structure of integral curves obtained by processing chronopotentiograms (CPG) of an aluminum anode polarized by a weak (at the level of one to several μA/cm2) current in chloride-containing medium is self-similar. This universal property allows us to find their fitting function and calculate the reduced (compressed dependence; the initial number of points is 1000, described by the number of AFC-14 modes). The initial curve is invariant with respect to its transformed counterpart after five-fold compression. For two different types of data, obtained with open circuit and with metal polarization by microcurrent, a common fitting platform related to its parameters can be obtained. There are various methods of detrending: i. e., obtaining a trend from the original trendless noise. The simplest method of obtaining a trend that does not give computational errors is obtained from a numerical integration formula using the trapezoidal method. It is this trend, obtained from the original trendless sequence without additional data processing errors, that it makes sense to define as a clear trend. The approximation parameters can be used to compare various random processes, including those caused by reactions on the metal surface with changes in its microrelief during redox processes.

Sobre autores

R. Nigmatullin

Kazan National Research Technical named after A. N. Tupolev

Email: renigmat@gmail.com
420015, Kazan, Russia

A. Dresvyannikov

Kazan National Research Technological University

Email: a.dresvyannikov@mail.ru
420015, Kazan, Russia

Bibliografia

  1. Nişancioğlu K., Holtan H. // Electrochim. Acta. 1979. № 24. P. 1229
  2. Hurlen T., Lian H., Ødegard O.S., Valant T. // Electrochim. Acta. 1984. № 29. P. 579
  3. Lenderink H.J.W., van der Linden M., de Wit J.H.W. // Electrochim. Acta. 1993. № 38. P. 1989
  4. Kolics A., Besing A.S, Baradlai P., et al. // J. Electrochem. Soc. 2001. № 148. P. B251.
  5. Verpoort F., Haemers T., Roose P., Maes J.P. // Appl. Spectr. 1999. № 53. P. 1528.
  6. Al Mayouf A.M. // Corr. Prev. Control. 1996. 43. P. 68.
  7. Radošević J., Kliškić M., Despić A.R. // J. Appl. Electrochem. 1992. № 22. P. 649.
  8. Garrigues L., Pebere N., Dabosi F. // Electrochim. Acta. 1996. № 41. P. 1209.
  9. Burri G., Luedi W., Haas O. // J. Electrochem. Soc. 1989. № 136. P. 267.
  10. Equey J.-F., Müller S., Desilvestro J., Haas O. // Ibid. Soc. 1992. № 139. P. 1499.
  11. Breslin C.B., Rudd A.L. // Corros. Sci. 2000. № 42. P. 1023.
  12. Aballe A., Bethencourt M., Botana F.J., Marcos M. // Electrochim. Acta. 1999. № 44. P. 4805.
  13. Pagitsas M., Sazou D. // J. Electroanal. Chem. 1999. № 471. P. 132.
  14. Uruchurtu J.C., Dawson J.L. // Corrosion. 1987. № 43. P. 19.
  15. Isaac J.W., K.R. Hebert J. // Electrochem. Soc. 1999. № 146. P. 502.
  16. Mansfeld F., Xiao H., Han L.T., Lee C.C. // Prog. Org. Coat. 1997. № 30. P. 89.
  17. Mansfeld F., Lee C.C. // J. Electrochem. Soc. 1997. № 144. P. 2068.
  18. Greisiger H., Schauer T. // Prog. Org. Coat. 2000. № 39. P. 31.
  19. Mills D.J., Mabbutt S. // Ibid. 2000. № 39. P. 41.
  20. Nagiub A., Mansfeld F. // Corros. Sci. 2001. № 43. P. 2001.
  21. Tan Y.J., Bailey S., Kinsella B. // Ibid. 2002. № 44. P. 1277.
  22. Aballe A., Bethencourt M., Botana F.J., et al. // Electrochim. Acta. 2002. № 47. P. 1415.
  23. Mansfeld F., Sun Z., Hsu C.H. // Ibid. 2001. № 46. P. 3651.
  24. Smulko J., Darowicki K., Zieliński A. // Ibid. 2002. № 47. P. 1297.
  25. Bierwagen G.P. //J. Electrochem. Soc. 1994. № 141. P. L155
  26. Bertocci U., Gabrielli C., Huet F., Keddam M. // Ibid. 1997. № 144. P. 31.
  27. Mansfeld F., Xiao H. // Ibid. 1994. № 141. P. 1403.
  28. Xiao H., Mansfeld F. // Ibid. 1994. № 141. P. 2332.
  29. Mansfeld F., Sun Z., Hsu C.H., Nagub A. // Corros. Sci. 2001. № 43. P. 341.
  30. Cheng Y.F., Luo J.L., Wilmott M. // Electrochim. Acta. 2000. № 45. P. 1763.
  31. Bautista A., Bertocci U., Huet F. // J. Electrochem. Soc. 2001. № 148. P. B412.
  32. Lowe A.M., Eren H., Bailey S.I. // Corros. Sci. 2003. № 45. P. 941.
  33. Cottis R.A., Al-Awadhi M.A.A., Al-Mazeedi H., Turgoose S. // Electrochim. Acta. 2001. № 46. P. 3665.
  34. Smulko J., Darowicki K. // J. Electroanal. Chem. 2003. № 545. P. 59.
  35. Aballe A., Huet F. // J. Electrochem. Soc. 2002. № 149. P. B89.
  36. Cottis R.A. Interpretation of electrochemical noise data // Corrosion. 2001. 57. P. 265.
  37. Mansfeld F. // Proceedings of the 18th Int. Conference on Noise and Fluctuations-ICNF; 2005 Aug 24; Los Angeles, CA (USA): American Institute of Physics; 2005. P. 623.
  38. Pride S.T, Scully J.R, Hudson J.L. // J. Electrochem Soc. 1994. № 141. P. 3028.
  39. Lou W, Ogura K. // Electrochim. Acta. 1995. № 40. P. 667.
  40. Sazou D., Diamantopoulou A., Pagitsas M. // J. Electroanal Chem. 2000. № 489. P. 1.
  41. Bassett M.R, Hudson J.L. // J. Phys. Chem. 1989. № 93. P. 2731.
  42. Dewald H.D., Parmananda P., Rollins R.W. // J. Electrochem Soc. 1993. № 140. P. 1969.
  43. Press W.H., Flannery B.P., Teukolsky S.A. et al. // Cambridge (UK). V. 1. Cambridge University Press, 1992. 963 p.
  44. Schauer T., Greisiger H., Dulog L. // Electrochim Acta. 1998. № 43. P. 2423.
  45. Burg J.P. Modern Spectrum Analysis. / Ed by D.G. Childers. New York (NY): IEEE Press, 1978. 334 p.
  46. Pujar M.G., Anita T., Shaikh H., et al. // Int. J. Electrochem. Sci. 2007. № 2. P. 301.
  47. Bertocci U., Frydman J., Gabrielli C., et al. // J. Electrochem. Soc. 1998. № 145. P. 2780.
  48. Van den Bos A. // IEEE Trans. Inform. Theory. 1997. № 17. P. 493.
  49. Edward J.A., Fitelson M.M. // IEEE Trans. Inform. Theory. 1973. № 19. P. 232.
  50. Nigmatullin Raoul R., Yang Quan Chen // Mathematics. 2023. № 11. P. 278.
  51. Nigmatullin R.R., Lino P., Maione G. // New Digital Signal Processing Methods Applications to Measurement and Diagnostics. ISBN978-3-030-45359-6 (eBook). https://doi.org/10.1007/978-3-030-45359-6. Springer, 2020.

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